Harnessing interpretable and unsupervised machine learning to address big data from modern X-ray diffraction

J. Venderley, K. Mallayya, M. Matty, M. Krogstad, J. Ru, G. Pleiss, V. Kishore, D. Mandrus, D. Phelan, L. Poudel, A. G. Wilson, K. Weinberger, P. Upreti, M. Norman, S. Rosenkranz, R. Osborn, and E.-A. Kim